IXTT2N170D2

IXTH2N170D2

IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

g

fs

V

1.4

2.2

S

C

iss

3650

pF

C

oss

V

206

pF

C

rss

80

pF

t

d(on)

28

ns

t

r

58

ns

t

d(off)

33

ns

t

f

106

ns

Q

g(on)

110

nC

Q

gs

V

12

nC

Q

gd

60

nC

R

thJC

0.22

C/W

R

thCS

TO-247

0.21

C/W

Safe-Operating-Area Specification

Characteristic Values

Symbol

Test Conditions

Min.

Typ.

Max.

SOA

V

204

W

Source-Drain Diode

Symbol

Test Conditions

Characteristic Values

(T

Min.

Typ.

Max.

V

SD

I

0.75

1.30

V

t

rr

2.8

μs

I

RM

45.0

A

Q

RM

63.0

μC

IXYS MOSFETs and IGBTs are covered

4,835,592

4,931,844

5,049,961

5,237,481

6,162,665

6,404,065 B1

6,683,344

6,727,585

7,005,734 B2

7,157,338B2

by one or more of the following U.S. patents: 4,860,072

5,017,508

5,063,307

5,381,025

6,259,123 B1

6,534,343

6,710,405 B2 6,759,692

7,063,975 B2

4,881,106

5,034,796

5,187,117

5,486,715

6,306,728 B1

6,583,505

6,710,463

6,771,478 B2 7,071,537

Note 1. Pulse test, t

 300s, duty cycle, d  2%.

Resistive Switching Times

V

R

I

V

TO-247 Outline

Terminals: 1 - Gate

2 - Drain

3 - Source

TO-268 Outline

Terminals: 1 - Gate

2,4 - Drain

3 - Source

e

P

1

2

3

Dim.

Millimeter

Inches

Min.

Max.

Min. Max.

A

4.7

5.3

.185

.209

A

1

2.2

2.54

.087

.102

A

2

2.2

2.6

.059

.098

b

1.0

1.4

.040

.055

b

1

1.65

2.13

.065

.084

b

2

2.87

3.12

.113

.123

C

.4

.8

.016

.031

D

20.80 21.46

.819

.845

E

15.75 16.26

.610

.640

e

5.20

5.72 0.205 0.225

L

19.81 20.32

.780

.800

L1

4.50

.177

P

3.55

3.65

.140

.144

Q

5.89

6.40 0.232 0.252

R

4.32

5.49

.170

.216

S

6.15 BSC

242 BSC