3D7502

Doc #97032

DATA DELAY DEVICES, INC.

4

5/19/97

Tel: 973-773-2299

Fax: 973-773-9672

http://www.datadelay.com

SILICON DELAY LINE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

OUTPUT:

Ambient Temperature: 25

10K

Ω ± 10%

Supply Voltage (Vcc): 5.0V

± 0.1V

5pf

± 10%

Input Pulse:

High = 3.0V

± 0.1V

Threshold:

1.5V (Rising & Falling)

Low = 0.0V

± 0.1V

Source Impedance:

50

Ω Max.

Rise/Fall Time:

3.0 ns Max. (measured

between 0.6V and 2.4V )

Pulse Width:

Period:

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

10K

Ω

470

Ω

5pf

Device

Under

Test

Digital

Scope

OUT

TRIG

IN

TRIG

Figure 2: Test Setup

DEVICE UNDER

TEST (DUT)

DIGITAL SCOPE

WAVEFORM

GENERATOR

OUT

IN

COMPUTER

SYSTEM

PRINTER

Figure 3: Timing Diagram

0.6V

0.6V

1.5V

1.5V

2.4V

2.4V

1.5V

1.5V

INPUT

SIGNAL

OUTPUT

SIGNAL