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AFIC10275GN Datasheet(PDF) 4 Page - NXP Semiconductors |
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AFIC10275GN Datasheet(HTML) 4 Page - NXP Semiconductors |
4 / 22 page ![]() 4 RF Device Data Freescale Semiconductor, Inc. AFIC10275N AFIC10275GN TYPICAL CHARACTERISTICS Figure 3. Normalized IDQ versus Case Temperature TC, CASE TEMPERATURE (C) 1.2 1.15 1.05 1.1 1 0.95 0.9 0.85 0.8 100 --50 0 --25 25 50 75 250 109 90 TJ, JUNCTION TEMPERATURE (C) Figure 4. MTTF versus Junction Temperature -- Pulse Note: MTTF value represents the total cumulative operating time under indicated test conditions. MTTF calculator available at: http://www.freescale.com/rf/calculators 107 106 105 110 130 150 170 190 210 230 108 ID =6.52 Amps 8.30 Amps --0.008 Slope (mA/C) --0.12 9.36 Amps IDQ1 IDQ2 VDD =50 Vdc Pulse Width = 128 sec 10% Duty Cycle IDQ2 IDQ1 VDD =50 Vdc IDQ1 =80 mA IDQ2 = 150 mA |
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