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AFIC10275N Datasheet(PDF) 3 Page - NXP Semiconductors |
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AFIC10275N Datasheet(HTML) 3 Page - NXP Semiconductors |
3 / 22 page AFIC10275N AFIC10275GN 3 RF Device Data Freescale Semiconductor, Inc. Table 5. Electrical Characteristics (TA =25C unless otherwise noted) Characteristic Symbol Min Typ Max Unit Stage 1 -- Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS = 100 Vdc, VGS =0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS =55 Vdc, VGS =0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS =1.5 Vdc, VDS =0 Vdc) IGSS — — 1 Adc Stage 1 -- On Characteristics Gate Threshold Voltage (VDS =10 Vdc, ID =52 Adc) VGS(th) 1.3 1.8 2.3 Vdc Fixture Gate Quiescent Voltage (VDD =50 Vdc, IDQ1 = 80 mAdc, Measured in Functional Test) VGG(Q) 6.0 7.0 8.0 Vdc Stage 2 -- Off Characteristics Zero Gate Voltage Drain Leakage Current (VDS = 100 Vdc, VGS =0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS =55 Vdc, VGS =0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS =1.5 Vdc, VDS =0 Vdc) IGSS — — 1 Adc Stage 2 -- On Characteristics Gate Threshold Voltage (VDS =10 Vdc, ID = 528 Adc) VGS(th) 1.3 1.8 2.3 Vdc Fixture Gate Quiescent Voltage (VDD =50 Vdc, IDQ2 = 150 mAdc, Measured in Functional Test) VGG(Q) 2.2 2.7 3.2 Vdc Drain--Source On--Voltage (VGS =10 Vdc, ID =1.6 Adc) VDS(on) — 0.25 — Vdc Functional Tests (1,2) (In Freescale Test Fixture, 50 ohm system) VDD =50 Vdc, IDQ1 =80 mA, IDQ2 = 150 mA, Pout = 250 W Peak (25 W Avg.), f = 1090 MHz, 128 sec Pulse Width, 10% Duty Cycle Power Gain Gps 30.5 32.1 34.0 dB 2nd Stage Drain Efficiency D 57.0 61.4 — % Load Mismatch/Ruggedness (In Freescale Test Fixture, 50 ohm system) IDQ1 =80 mA, IDQ2 = 150 mA Frequency (MHz) Signal Type VSWR Pin (W) Test Voltage, VDD Result 1090 Pulse (128 sec, 10% Duty Cycle) > 10:1 at all Phase Angles 0.345 W Peak (3 dB Overdrive) 50 No Device Degradation Table 6. Ordering Information Device Tape and Reel Information Package AFIC10275NR1 R1 Suffix = 500 Units, 44 mm Tape Width, 13--inch Reel TO--270WB--14 AFIC10275GNR1 TO--270WBG--14 1. Part internally input matched. 2. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull wing (GN) parts. |
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