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RO3164D Datasheet(PDF) 2 Page - Murata Manufacturing Co., Ltd. |
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RO3164D Datasheet(HTML) 2 Page - Murata Manufacturing Co., Ltd. |
2 / 3 page ©2010-2015 by Murata Electronics N.A., Inc. RO3164D/D-1/D-2 (R) 2/10/15 Page 2 of 3 www.murata.com Pin Connection 1NC 2 Terminal 3NC 4NC 5 Terminal 6NC Power Test Electrical Connections The SAW resonator is bidirectional and may be installed with either orientation. The two terminals are interchangeable and unnumbered. The callout NC indicates no internal connection. The NC pads assist with mechanical positioning and stability. External grounding of the NC pads is recommended to help reduce parasitic capacitance in the circuit. Typical Test Circuit The test circuit inductor, LTEST, is tuned to resonate with the static capacitance, CO, at FC. Typical Application Circuits From 50 Ω Network Analyzer To 50 Ω Network Analyzer 2 3 6 5 4 1 Low-Loss Matching Network to 50 Ω 50 Ω Source at F C P INCIDENT P REFLECTED 2 3 6 5 4 1 Modulation Input ROXXXXC Bottom View 200k Ω C1 L1 (Antenna) 47 +9VDC C2 RF Bypass 470 Typical Low-Power Transmitter Application 2 3 6 5 4 1 +VDC ROXXXXC Bottom View 200k Ω C1 L1 +VDC C2 RF Bypass Typical Local Oscillator Application Output 2 3 6 5 4 1 Case Dimensions Dimension mm Inches Min Nom Max Min Nom Max A 3.60 3.80 4.0 0.14 0.15 0.16 B 3.60 3.80 4.0 0.14 0.15 0.16 C 1.00 1.20 1.40 0.04 0.05 0.055 D 0.95 1.10 1.25 0.033 0.043 0.05 E 2.39 2.54 2.69 0.090 0.10 0.110 G 0.90 1.0 1.10 0.035 0.04 0.043 H 1.90 2.0 2.10 0.75 0.08 0.83 I 0.50 0.6 0.70 0.020 0.024 0.028 J 1.70 1.8 1.90 0.067 0.07 0.075 1 2 3 6 5 4 1 2 3 6 5 4 A BC D J E GH I Electrical Test 1. Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after manufacture, decreasing in subse- quent years. 2. The center frequency, fC, is measured at the minimum insertion loss point, ILMIN, with the resonator in the 50 Ω test system (VSWR ≤ 1.2:1). The shunt inductance, LTEST, is tuned for parallel resonance with CO at fC. Typically, fOSCILLATOR or fTRANSMITTER is approximately equal to the resonator fC. 3. One or more of the following United States patents apply: 4,454,488 and 4,616,197. 4. Typically, equipment utilizing this device requires emissions testing and government approval, which is the responsibility of the equipment manufacturer. 5. Unless noted otherwise, case temperature TC = +25°C±2°C. 6. The design, manufacturing process, and specifications of this device are subject to change without notice. 7. Derived mathematically from one or more of the following directly measured parameters: fC, IL, 3 dB bandwidth, fC versus TC, and CO. 8. Turnover temperature, TO, is the temperature of maximum (or turnover) frequency, fO. The nominal frequency at any case temperature, TC, may be calculated from: f = fO [1 - FTC (TO -TC)2]. Typically oscillator TO is approximately equal to the specified resonator TO. 9. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided for reference only. The capacitance CO is the static (nonmotional) capacitance between the two terminals measured at low frequency (10 MHz) with a capacitance meter. The measurement includes parasitic capacitance with "NC” pads unconnected. Case parasitic capacitance is approximately 0.05 pF. Transducer parallel capacitance can by calculated as: CP ≈ CO -0.05pF. NOTES: |
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