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LTC2220 Datasheet(PDF) 19 Page - Linear Technology |
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LTC2220 Datasheet(HTML) 19 Page - Linear Technology |
19 / 32 page LTC2220/LTC2221 19 22201fa Each pipelined stage shown in Figure 1 contains an ADC, a reconstruction DAC and an interstage residue amplifier. In operation, the ADC quantizes the input to the stage and the quantized value is subtracted from the input by the DAC to produce a residue. The residue is amplified and output by the residue amplifier. Successive stages operate out of phase so that when the odd stages are outputting their residue, the even stages are acquiring that residue and vice versa. When ENC is low, the analog input is sampled differentially directly onto the input sample-and-hold capacitors, inside the “Input S/H” shown in the block diagram. At the instant that ENC transitions from low to high, the sampled input is held. While ENC is high, the held input voltage is buffered by the S/H amplifier which drives the first pipelined ADC stage. The first stage acquires the output of the S/H during this high phase of ENC. When ENC goes back low, the first stage produces its residue which is acquired by the second stage. At the same time, the input S/H goes back to acquiring the analog input. When ENC goes back high, the second stage produces its residue which is acquired by the third stage. An identical process is re- peated for the third and fourth stages, resulting in a fourth stage residue that is sent to the fifth stage ADC for final evaluation. Each ADC stage following the first has additional range to accommodate flash and amplifier offset errors. Results from all of the ADC stages are digitally synchronized such that the results can be properly combined in the correction logic before being sent to the output buffer. SAMPLE/HOLD OPERATION AND INPUT DRIVE Sample/Hold Operation Figure 2 shows an equivalent circuit for the LTC2220/ LTC2221 CMOS differential sample-and-hold. The analog inputs are connected to the sampling capacitors (CSAMPLE) through NMOS transistors. The capacitors shown at- tached to each input (CPARASITIC) are the summation of all other capacitance associated with each input. During the sample phase when ENC is low, the transistors connect the analog inputs to the sampling capacitors and they charge to, and track the differential input voltage. When ENC transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when ENC is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As ENC transitions from high to low, the inputs are reconnected to the sampling capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen. CSAMPLE 1.6pF VDD VDD LTC2220/LTC2221 AIN + 22201 F02 CSAMPLE 1.6pF VDD AIN – ENC– ENC+ 1.6V 6k 1.6V 6k CPARASITIC 1pF CPARASITIC 1pF 15 Ω 15 Ω Figure 2. Equivalent Input Circuit Single-Ended Input For cost sensitive applications, the analog inputs can be driven single-ended. With a single-ended input the har- monic distortion and INL will degrade, but the SNR and DNL will remain unchanged. For a single-ended input, AIN+ should be driven with the input signal and AIN– should be connected to 1.6V or VCM. Common Mode Bias For optimal performance the analog inputs should be driven differentially. Each input should swing ±0.5V for APPLICATIO S I FOR ATIO |
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