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CY7C1441KV25 Datasheet(PDF) 27 Page - Cypress Semiconductor |
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CY7C1441KV25 Datasheet(HTML) 27 Page - Cypress Semiconductor |
27 / 29 page ![]() Document Number: 001-94722 Rev. *E Page 27 of 29 CY7C1441KV25 Acronyms Document Conventions Units of Measure Table 2. Acronyms Used in this Document Acronym Description CE Chip Enable CMOS Complementary Metal Oxide Semiconductor EIA Electronic Industries Alliance FBGA Fine-Pitch Ball Grid Array I/O Input/Output JEDEC Joint Electron Devices Engineering Council JTAG Joint Test Action Group OE Output Enable SRAM Static Random Access Memory TAP Test Access Port TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TTL Transistor-Transistor Logic Table 3. Units of Measure Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere mA milliampere mm millimeter ms millisecond mV millivolt ns nanosecond ohm % percent pF picofarad Vvolt Wwatt |
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