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CY7C1440KV33 Datasheet(PDF) 31 Page - Cypress Semiconductor |
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CY7C1440KV33 Datasheet(HTML) 31 Page - Cypress Semiconductor |
31 / 33 page CY7C1440KV33 CY7C1442KV33 CY7C1440KVE33 Document Number: 001-66676 Rev. *G Page 31 of 33 Acronyms Document Conventions Units of Measure Table 2. Acronyms Used in this Document Acronym Description CE Chip Enable CEN Clock Enable CMOS Complementary Metal Oxide Semiconductor FBGA Fine-Pitch Ball Grid Array I/O Input/Output JTAG Joint Test Action Group NoBL No Bus Latency OE Output Enable SRAM Static Random Access Memory TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TQFP Thin Quad Flat Pack WE Write Enable ECC Error Correcting Code Table 3. Units of Measure Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere mA milliampere mm millimeter ms millisecond ns nanosecond % percent pF picofarad Vvolt Wwatt |
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