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CY7C1440KV25 Datasheet(PDF) 28 Page - Cypress Semiconductor |
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CY7C1440KV25 Datasheet(HTML) 28 Page - Cypress Semiconductor |
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28 / 30 page  CY7C1440KV25 Document Number: 001-94719 Rev. *D Page 28 of 30 Acronyms Document Conventions Units of Measure Table 2. Acronyms Used in this Document Acronym Description CMOS Complementary Metal Oxide Semiconductor CE Chip Enable FBGA Fine-Pitch Ball Grid Array I/O Input/Output JTAG Joint Test Action Group LSB Least Significant Bit MSB Most Significant Bit OE Output Enable SRAM Static Random Access Memory TCK Test Clock TDI Test Data-In TDO Test Data-Out TMS Test Mode Select TTL Transistor-Transistor Logic WE Write Enable Table 3. Units of Measure Symbol Unit of Measure °C degree Celsius MHz megahertz µA microampere µs microsecond mA milliampere mm millimeter ms millisecond mV millivolt ns nanosecond % percent pF picofarad Vvolt Wwatt |
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