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CY7C1440KV25 Datasheet(PDF) 18 Page - Cypress Semiconductor

Part # CY7C1440KV25
Description  36-Mbit (1M36) Pipelined Sync SRAM
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Manufacturer  CYPRESS [Cypress Semiconductor]
Direct Link  http://www.cypress.com
Logo CYPRESS - Cypress Semiconductor

CY7C1440KV25 Datasheet(HTML) 18 Page - Cypress Semiconductor

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CY7C1440KV25
Document Number: 001-94719 Rev. *D
Page 18 of 30
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 °C to +150 °C
Ambient Temperature
with Power Applied .................................. –55 °C to +125 °C
Supply Voltage on VDD Relative to GND .....–0.5 V to +3.6 V
Supply Voltage on VDDQ Relative to GND .... –0.5 V to +VDD
DC Voltage Applied to Outputs
in Tristate ..........................................–0.5 V to VDDQ + 0.5 V
DC Input Voltage ................................ –0.5 V to VDD + 0.5 V
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ......................... > 2001 V
Latch-up Current ................................................... > 200 mA
Operating Range
Range
Ambient
Temperature
VDD
VDDQ
Industrial
–40 °C to +85 °C
2.5 V
+ 5%
2.5 V – 5%
to VDD
Neutron Soft Error Immunity
Parameter
Description
Test
Conditions Typ Max* Unit
LSBU
Logical
Single-Bit
Upsets
25 °C
<5
5
FIT/
Mb
LMBU
Logical
Multi-Bit
Upsets
25 °C
0
0.01 FIT/
Mb
SEL
Single Event
Latch up
85 °C
0
0.1
FIT/
Dev
* No LMBU or SEL events occurred during testing; this column represents a
statistical
2, 95% confidence limit calculation. For more details refer to Application
Note AN54908 “Accelerated Neutron SER Testing and Calculation of Terrestrial
Failure Rates”.
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Over the Operating Range
Parameter [15, 16]
Description
Test Conditions
Min
Max
Unit
VDD
Power Supply Voltage
2.375
2.625
V
VDDQ
I/O Supply Voltage
for 2.5 V I/O
2.375
VDD
V
VOH
Output HIGH Voltage
for 2.5 V I/O, IOH = –1.0 mA
2.0
V
VOL
Output LOW Voltage
for 2.5 V I/O, IOL = 1.0 mA
0.4
V
VIH
Input HIGH Voltage[15]
for 2.5 V I/O
1.7
VDD + 0.3 V
V
VIL
Input LOW Voltage[15]
for 2.5 V I/O
–0.3
0.7
V
IX
Input Leakage Current except ZZ
and MODE
GND
 VI  VDDQ
–5
5
A
Input Current of MODE
Input = VSS
–30
A
Input = VDD
–5
A
Input Current of ZZ
Input = VSS
–5
A
Input = VDD
–30
A
IOZ
Output Leakage Current
GND
 VI  VDDQ, Output Disabled
–5
5
A
Notes
15. Overshoot: VIH(AC) < VDD + 1.5 V (Pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (Pulse width less than tCYC/2).
16. TPower-up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ < VDD.


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