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TPA3220 Datasheet(PDF) 24 Page - Texas Instruments |
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TPA3220 Datasheet(HTML) 24 Page - Texas Instruments |
24 / 39 page ![]() 24 TPA3220 SLASEN3 – JANUARY 2018 www.ti.com Product Folder Links: TPA3220 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated (1) Stuck at Fault occurs when input OSC_IO input signal frequency drops below minimum frequency given in the Electrical Characteristics table of this data sheet. 9.4.5.7 Fault Handling If a fault situation occurs while in operation, the device acts accordingly to the fault being a global or a channel fault. A global fault is a chip-wide fault situation and causes all PWM activity of the device to be shut down, and will assert FAULT low. A global fault is a latching fault and clearing FAULT and restarting operation requires resetting the device by toggling RESET. De-asserting RESET should never be allowed with excessive system temperature, so it is advised to monitor RESET with a system microcontroller and only release RESET (RESET high) if the OTW_CLIP signal is cleared (high). A channel fault results in shutdown of the PWM activity of the affected channel(s). Note that asserting RESET low forces the FAULT signal high, independent of faults being present. Table 6. Error Reporting Fault/Event Fault/Event Description Global or Channel Reporting Method Latched/Self Clearing Action needed to Clear Output FETs PVDD_X UVP Voltage Fault Global FAULT pin Self Clearing Increase affected supply voltage HI-Z PVDD_X OVP AVDD UVP POR (AVDD UVP) Power On Reset Global FAULT pin Self Clearing Allow AVDD to rise HI-Z OTW Thermal Warning Global OTW pin Self Clearing Cool below OTW threshold Normal operation OTE Thermal Shutdown Global FAULT pin Latched Toggle RESET HI-Z OLP (CB3C>1.7 ms) OC Shutdown Channel FAULT pin Latched Toggle RESET HI-Z CB3C OC Limiting Channel None Self Clearing Reduce signal level or remove short Flip state, cycle by cycle at fs/3 Stuck at Fault(1) No OSC_IO activity in Slave Mode Global None Self Clearing Resume OSC_IO activity HI-Z |
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