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K4N26323AE Datasheet(PDF) 36 Page - Samsung semiconductor |
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K4N26323AE Datasheet(HTML) 36 Page - Samsung semiconductor |
36 / 52 page - 36 - Rev. 1.7 (Jan. 2003) 128M GDDR2 SDRAM K4N26323AE-GC Note 1 : - The JEDEC DDR-II specification currently defines the output data valid window(tDV) as the time period when the data strobe and all data associated with that data strobe are coincidentally valid. - The previously used definition of tDV(=0.35tCK) artificially penalizes system timing budgets by assuming the worst case output valid window even then the clock duty cycle applied to the device is better than 45/55% - A new AC timing term, tQH which stands for data output hold time from DQS is defined to account for clock duty cycle variation and replaces tDV - tQHmin = tHP-X where . tHP=Minimum half clock period for any given cycle and is defined by clock high or clock low time(tCH,tCL) . X=A frequency dependent timing allowance account for tDQSQmax tQH Timing (CL7, BL4) 17 8 tHP CK, CK DQS DQ CS 69 01 COMMAND READA tQH Da0 tDQSQ(max) tDQSQ(max) Da1 Da2 Da3 |
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