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TRENCH Datasheet, PDF

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Searched Keyword : 'TRENCH' - Total: 8 (1/1) Pages
ManufacturerPart #DatasheetDescription
Company Logo Img
Micro Commercial Compon... 		MIW15N120FA Datasheet pdf image
1Mb/7P		 Trench and Field Stop IGBT 1200V 15A
Rev.3-1-02192022
MIW25N120FA Datasheet pdf image
1,023Kb/7P		 Trench and Field Stop IGBT 1200V 25A
Rev.3-1-02182022
MIW30N65FLA Datasheet pdf image
1,011Kb/7P		 Trench and Field Stop IGBT 650V 30A
Rev.3-2-04282022
MIW50N65F Datasheet pdf image
1Mb/10P		 Trench and Field Stop IGBT 650V 50A
Rev.3-3-04152022
MIW40N65RA Datasheet pdf image
1Mb/10P		 Trench and Field Stop IGBT 650V 40A
Rev.3-1-06122022
MIW40N120 Datasheet pdf image
2Mb/6P		 Trench and Field Stop IGBT 1200V 40A
Rev.3-1-05072020
MIW40N120FLA Datasheet pdf image
4Mb/7P		 Trench and Field Stop IGBT 1200V 40A
Rev.3-1-02202022
MIW30N65FA Datasheet pdf image
1Mb/6P		 Trench and Field Stop IGBT 650V 30A
Rev.3-2-04282022

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What is TRENCH

Trench is one of the electronic component manufacturing technologies, and is used in the process of making semiconductor devices.

Trench technology is a technology developed to improve the electrical performance of semiconductor devices.

Trench technology redesigns the structure of semiconductor devices to improve device heat generation and performance degradation.

With trench technology, a small pit (trench) can be dug inside a semiconductor device to increase the surface area of the device.

This improves electrical performance because the path through which the current flows is shorter.

Trench technology is primarily used in high-performance semiconductor devices such as MOSFETs (Metal Oxide Semiconductor Field Effect Transistors).

These semiconductor devices are used in high-speed electronic circuits, power conversion devices, and automotive control devices.

Trench technology plays a very important role in the modern electronic component industry as it improves device performance and efficiency.

*This information is for general informational purposes only, we will not be liable for any loss or damage caused by the above information.


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