1. Device Overview:

· Device: 3D702
· Type: Silicon Delay Line/Manchester Receiver
· Function: Converts encoded data (likely Manchester encoded) to a standard signal. It recovers the clock and data from a serial input.

2. Key Features & Specifications:

· Input Baud Rate Range: 5 - 50 MHz (Megahertz). Can vary based on temperature.
· Input Duty Cycle: The percentage of time the signal is HIGH can vary from 42.5% to 57.5%.
· Output Signals:
* Clock (CLK): Recovered clock signal. Has a low-going pulse (tCWL) for a portion of each bit cell. The clock-high duration is dependent on the baud rate.
* Data (DATB): Recovered data signal.
· Timing Characteristics (Relative to input data edge):
* tCL (Input Data Edge to Clock Falling Edge): 0.75 ns
* tCWL (Clock Width Low): Approximately 500ns.
* tCD (Clock Falling Edge to Data Transition): 3.0 - 5.0 ns.
* Bit Cell Time: 1000 / Baud Rate.

3. Electrical Characteristics:

· DC Supply Voltage (Vdd): -0.3 to 7.0V
· Input Voltages (Vih, Vil):
* Vih (High): 2.0V
* Vil (Low): 0.8V
· Output Current (Ioh, Iol): Defined at specific voltage conditions (Vdd = 4.75V) - see table.
· Input/Output Capacitance (Cld): 10pf typical. Average load capacitance is 25pf max.

4. Absolute Maximum Ratings:

· Supply Voltage: -0.3 to 7.0 V
· Input Pin Voltage: -0.3 to Vdd + 0.3V
· Input Pin Current: -10 to 10 mA
· Storage Temperature: -55 to 150 °C
· Lead Temperature: 300 °C (for 10 seconds)

5. Test Conditions (for automated testing):

· Ambient Temperature: 25°C ± 3°C
· Supply Voltage (Vcc): 5.0V ± 0.1V
· Input Pulse: High = 3.0V ± 0.1V, Low = 0.0V ± 0.1V
· Load Resistance (Rload): 10 kΩ ± 10%
· Load Capacitance (Cload): 5 pf ± 10%
· Source Impedance: 50 Ω (Ohms) Max.
· Rise/Fall Time: 3.0 ns (Nanoseconds)
· Input Pulse Width: 1/(2 \* Baud Rate)
· Test Period: 1/Baud Rate

6. Figures:

· Figure 1 (Timing Diagram): Illustrates the relationship between the input data, recovered clock, and recovered data. Shows clock width low (tCWL) and other timing relationships.
· Figure 2 (Test Setup): Illustrates a general schematic of the test setup, including the signal generator, device under test, and oscilloscope.
· Figure 2 (Timing Diagram): Shows the input and output waveforms with timing parameters labeled.

Important Notes:

· Manchester Encoding: The device likely deals with Manchester encoded signals (common for serial communication).
· Temperature Dependency: Several parameters, particularly the input baud rate tolerance, are dependent on the operating temperature.
· DC/AC/Absolute Maximums: Pay close attention to the differences between the absolute maximum ratings (which represent extreme conditions) and the typical/minimum/maximum values in the electrical characteristics. Operating within the specified ranges is critical for reliable operation.